About MEI

MEI IC is the brainchild of Conlyn Chan, who earned her degree at the Fashion Institute of Technology (FIT), the world's leading authority on Image Consulting. While at FIT, she mastered the interplay of color, proportion, texture, design and other factors that shape fashion. Conlyn has helped organize various high profile fashion events, including New York Fashion Week, the L Magazine Fashion Show and fashion shows for FIT, Columbia, Parsons and NYU alumni. She also regularly travels to Paris, London, Hong Kong, Los Angeles, Tokyo, Rome, Dublin, Seoul and the Hamptons to bring the latest fashion trends to her clients and provide them with the most innovative and creative imaging solutions.